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Figure 6
Comparison between the volume-integrated Bragg reflection intensity 〈I111(t)〉vol,real (blue line), and the Bragg reflection intensity obtained for the effective dose 〈I111(t)〉rel averaged over 50 XTANT realizations (red line). The volume integration was performed for a silicon sample with 64 atoms in the simulation box, using the XTANT results for the doses marked in blue in Fig. 1[link], and assuming a pulse duration of 6 fs FWHM and photon energy of 50 eV. The same parameters were used for the effective dose simulation, except for the dose itself, set to Deff = 4.51 eV atom−1.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 32| Part 5| September 2025| Pages 1106-1115
https://doi.org/10.1107/S1600577525006939
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