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Figure 7
Threshold energy statistical distribution across the entire pixel matrix for the case of the silicon sensor, before and after the threshold trimming procedure, tested with Mo X-ray fluorescence. The symbol σ represents the standard deviation.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 33| Part 1| January 2026| Pages 98-105
https://doi.org/10.1107/S1600577525009026
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