Development of arrival-time diagnostic tool for X-ray pump–probe experiments at Shanghai Soft X-ray Free Electron Laser

Qiao, Z.; Fan, J.; Gao, Z.; Nie, Y.; Wen, P.; Wang, X.; Yan, K.; Ren, H.; Wang, B.; Jiang, J.; Shen, Y.; Zhang, Y.; Zhu, W.; Shu, G.; Xue, C.; Guo, Z.; Liu, Z.; Yang, H.; Qi, Z.; Zhang, K.; Liu, T.; Wang, Z.; Feng, C.; Tong, Y.; Liu, Z.; Jiang, H.

doi:10.1107/S1600577525010653

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

IUCr IT WDC

home archive editors for authors for readers submit open access

view article

Figure 1
Schematic drawings of the timing diagnostic tool at the CSI endstation of the SPB beamline at SXFEL. The top figure shows the layout of the CSI endstation with a zoomed-in sample chamber. The bottom figure shows the setup of the arrival-time tool, where the transmitted beam from the sample is reflected into the spectrometer for the spectral-encoding method and the reflected or scattered beam is acquired by the inline microscope for the spatial-imaging method. (The red line shows the femtosecond laser and the SC beam; the green line shows the X-ray beam; LPF: low-pass filter; HPF: high-pass filter; DR: dispersion rod; M1: high-reflection mirror in sample chamber; M2: high-reflection mirror in sample chamber.)

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 33| Part 1| January 2026| Pages 44-51

https://doi.org/10.1107/S1600577525010653

Open

access

Follow J. Synchrotron Rad.

Search IUCr Journals		doi		Advanced search
Author		volume	page