Development of arrival-time diagnostic tool for X-ray pump–probe experiments at Shanghai Soft X-ray Free Electron Laser

Qiao, Z.; Fan, J.; Gao, Z.; Nie, Y.; Wen, P.; Wang, X.; Yan, K.; Ren, H.; Wang, B.; Jiang, J.; Shen, Y.; Zhang, Y.; Zhu, W.; Shu, G.; Xue, C.; Guo, Z.; Liu, Z.; Yang, H.; Qi, Z.; Zhang, K.; Liu, T.; Wang, Z.; Feng, C.; Tong, Y.; Liu, Z.; Jiang, H.

doi:10.1107/S1600577525010653

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Figure 2
Spectral-encoding timing diagnostics of XFEL pulses. (a) Spectrum versus SC beam delay time for a YAG sample. (b) Spectrum versus SC beam delay for a silicon nitride sample. (c) Spectrum line profile at a delay of 0 for a YAG sample. (d) Spectrum line profile at a delay of 0 for a silicon nitride sample.

JOURNAL OF
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ISSN: 1600-5775

Volume 33| Part 1| January 2026| Pages 44-51

https://doi.org/10.1107/S1600577525010653

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