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Figure 9
Determining the sample-to-detector distance (SDD) for optimum fringe contrast. The representative sample is an Ni wire of 500 µm diameter embedded in a polystyrene container filled with Ni powder. (a) Flat-field corrected projection of the edge of the container. This image is considered pure absorption as it was taken from a short SDD of 0.1 m. (b) Projection at an SDD of 1.15 m, showing edge enhancement at the interface. (c) Projection at an SDD of 4 m. A profile of the region of interest (ROI) marked in panel (a) is displayed in panels (a)–(c). (d) Flat-field corrected projection of the Ni wire embedded in Ni powder in the container at an SDD of 0.1 m. (e)–(f) Images at SDDs of 1.15 and 4 m, respectively. The dashed lines in panels (c) and (f) indicate the superimposed beams of some of the ten wigglers. The arrows in (c) indicate the resolved front and rear edges of the cubic container, illuminated by each of the superimposed beams.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 33| Part 1| January 2026| Pages 181-194
https://doi.org/10.1107/S1600577525010057
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