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Figure 3
Illustration of the D&P technical challenges related to the inhomogeneities of the thin electrolyte film with (a) the XPS (Cs 3d) peak shift at the Pt/CsOH 1 M interface depending on the applied potential, which can be used as a means of validating an analysis spot electrically connected to the bulk. (b–d) Possible morphologies of the electrolyte thin film at the analysis spot. (e–f) Ni 2p3/2 XPS spectra at a Ni/KOH 0.1 M interface on five spots along the horizontal x axis separated by 50 µm parallel to the electrode plane: (e) was recorded on metallic Ni and illustrates a very reproducible signal over the probed zone; (f) was recorded on oxidized Ni and shows the effect of strong inhomogeneities in the film thickness.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 33| Part 1| January 2026| Pages 130-141
https://doi.org/10.1107/S1600577525008811
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