Phase and absorbance retrieval in X-ray holographic microscopy under weak illumination using physics-driven neural networks

Kim, J.; Lim, J.; Jo, S.; Park, S.; Lee, S.J.

doi:10.1107/S1600577526003188

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Figure 1
Overall workflow of the proposed MorpHoloNet-X for single-shot phase and absorbance retrieval in X-ray holographic microscopy. (a) Object mask generation from a hard X-ray hologram. (b) Neural network architecture of MorpHoloNet-X. (c) Pre-training process of MorpHoloNet-X using prior knowledge about object mask label arrays around the approximate depth of target objects. Training MorpHoloNet-X with (d) boundary conditions and (e) forward wave propagation using the angular spectrum method (ASM) operator.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 33| Part 3| May 2026| Pages 794-805

https://doi.org/10.1107/S1600577526003188

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