Phase and absorbance retrieval in X-ray holographic microscopy under weak illumination using physics-driven neural networks

Kim, J.; Lim, J.; Jo, S.; Park, S.; Lee, S.J.

doi:10.1107/S1600577526003188

Journal of Synchrotron Radiation Journal of
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Figure 5
Structural similarity index measure (SSIM) maps for absorbance maps reconstructed from synthetic holograms using (a) the Gerchberg–Saxton (GS) algorithm, (b) residual U-Net (ResUNet), and (c) MorpHoloNet-X. Scale bars are 100 nm.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 33| Part 3| May 2026| Pages 794-805

https://doi.org/10.1107/S1600577526003188

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