2D-RIXS: resonant inelastic X-ray scattering microscopy with high energy and spatial resolutions

Yamamoto, K.; Suzuki, H.; Miyawaki, J.

doi:10.1107/S1600577526000573

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

IUCr IT WDC

home archive editors for authors for readers submit open access

view article

Figure 2
(a) Scatter plot of detected photons around the sharp edge of the test chart made of Co thin film, as a function of photon energy and vertical position $[\tilde{Z\,}\!]$ around $[\tilde{Z\,}\!]$ = −0.014 mm. The right panel shows the corresponding line profile. (b) Line profiles measured at different Z positions. The solid lines are the fitted curves by an error function. $[\tilde{Z\,}\!_{\rm {edge}}]$ indicates the center of the fitted error function and the line shape is plotted as a function of deviation from $[\tilde{Z\,}\!_{\rm {edge}}]$ , $[\Delta\tilde{Z\,}\!]$ = $[\tilde{Z\,}\!-\tilde{Z\,}\!_{\rm {edge}}]$ . $[\tilde{Z\,}\!_{\rm {edge}}]$ was changed by moving the test pattern. (c) The estimated resolution as a function of $[\tilde{Z\,}\!]$ position. The solid line shows the resolution determined by ray-tracing simulation (offset from the ideal Wolter mirror position δ = 0), while the dashed line shows the resolution considering the finite alignment error (δ = 0.06 mm).

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 33| Part 3| May 2026| Pages 739-745

https://doi.org/10.1107/S1600577526000573

Open

access

Follow J. Synchrotron Rad.

Search IUCr Journals		doi		Advanced search
Author		volume	page