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Figure 4
(a) Optical microscope image of exfoliated NiPS3 nanoflakes. The dashed square indicates the region investigated by the RIXS imaging. (b) Example scatter plot showing detected X-ray photons versus photon energy loss (horizontal axis) and vertical position Mathematical equation (vertical axis) at a single horizontal position X. Blue- and red-shaded areas indicate the energy integration windows used to generate the maps in (c) and (d), respectively. The solid line indicates the horizontal position at which the RIXS data in panel (b) was acquired. (c, d) Colormap of RIXS intensity of the NiPS3 nanoflakes acquired at the Ni L3 edge, obtained by integrating photon counts within the (c) inelastic and (d) elastic regions, respectively. The excitation energy varies vertically across the FOV, with a total bandwidth of approximately 0.6 eV.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 33| Part 3| May 2026| Pages 739-745
https://doi.org/10.1107/S1600577526000573
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