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Figure 7
Reorientation of individual grains by thermal cycling test. IPF (ND) maps of the β-Sn solder in the first specimen are shown before (a) and after (b) thermal cycling. The orientations of selected grains (A, B, C, D, E, F, and G) before thermal cycling are presented in IPFs (c, d, and e), while the orientations of the same grains (A′, B′, C′, D′, E′, F′, and G′) after thermal cycling are shown in IPFs (f, g, and h).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 33| Part 3| May 2026| Pages 617-631
https://doi.org/10.1107/S1600577526001475
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