Development of electron source feedback for enhanced X-ray beam stability at NSLS-II

Kongtawong, S.; Hidaka, Y.; Yan, H.; Wang, G.; Ha, K.; Tian, Y.; Mead, J.; Padrazo, D.; Chu, Y.; Shaftan, T.

doi:10.1107/S160057752600233X

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Figure 11
Analysis of background fluctuations in the ptychography reconstructions. (a) One-dimensional traces of amplitude and phase extracted from the ROI (raw data). (b) Corresponding traces after linear detrending. (c) Histograms of the detrended amplitude and phase values.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 33| Part 3| May 2026| Pages 585-595

https://doi.org/10.1107/S160057752600233X

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