Total-reflection-based microscope compatible with X-ray and visible light for sample positioning

Yoshinaga, K.; O'Neal, J.T.; Sakurai, K.; Egawa, S.; Furuya, N.; Shimamura, T.; Takeo, Y.; Nakata, Y.; Nagayama, Y.; Kishimoto, H.; Senba, Y.; Shimura, M.; Kodama, T.; Yabashi, M.; Ohashi, H.; Kimura, T.

doi:10.1107/S1600577526003127

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Figure 2
Spatial resolution evaluation using a knife edge. (a) Schematic illustration of the knife edge and the VLM image. (b, c) Intensity lineout along the (b) horizontal and (c) vertical dashed lines in (a).

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 33| Part 3| May 2026| Pages 604-608

https://doi.org/10.1107/S1600577526003127

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