Total-reflection-based microscope compatible with X-ray and visible light for sample positioning

Yoshinaga, K.; O'Neal, J.T.; Sakurai, K.; Egawa, S.; Furuya, N.; Shimamura, T.; Takeo, Y.; Nakata, Y.; Nagayama, Y.; Kishimoto, H.; Senba, Y.; Shimura, M.; Kodama, T.; Yabashi, M.; Ohashi, H.; Kimura, T.

doi:10.1107/S1600577526003127

Journal of Synchrotron Radiation Journal of
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Figure 3
ROI positioning and soft X-ray ptychographic imaging. (a) Schematic illustration of a sample chip. (b, c) Images of the sample window observed with (b) a commercial VLM and (c) our VLM system. (d) Reconstructed phase image of the ROI positioned using our VLM system.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 33| Part 3| May 2026| Pages 604-608

https://doi.org/10.1107/S1600577526003127

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