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Figure 3
A YAG fragment is glued to the table of the upstream anvil to allow for alignment. (Left) A diagram indicating the anvil thickness, t and offset from YAG to sample, h which are measured in advance. (Middle) Photograph of table with adhered YAG. The CeO2 sample visible through the anvil is shifted slightly to the right by microscope parallax. (Right) Image of XFEL beam visible on YAG fragment during alignment (fuchsia arrow). The halo to the left of the image is a reflection of the light, other white sections are damaged pixels. Scale bars are 200 µm.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 33| Part 3| May 2026| Pages 552-561
https://doi.org/10.1107/S1600577526001608
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