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Figure 4
Diagram of the alignment procedure. (1) The position of the XFEL beam on the imaging camera at the calibration plane is noted using the YAG screen on the calibration card. (2) The back of the upstream anvil is imaged and positioned such that the XFEL hits the YAG. (3) The cell is translated on the beam axis until the image of the XFEL spot is at the same location as it was on the calibration YAG screen in panel 1. (4) The cell is moved by the previously measured offset to get from the YAG on the upstream anvil to the sample.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 33| Part 3| May 2026| Pages 552-561
https://doi.org/10.1107/S1600577526001608
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