view article
Figure 5
X-ray diffraction of CeO2 at 4 GPa taken at 25% beam intensity showing images and integrated patterns. (Top) Mean of the diffraction patterns from 2705 XFEL pulses, with detectors `q2' and `q3' at 197 and 167 mm from the sample, respectively. These positions were used for the other samples. (Bottom) Mean of the diffraction patterns from 894 pulses, with detectors `q2' and `q3' at 84 and 113 mm from the sample, respectively. This provides an angular coverage beyond what is accessible in most DAC designs. The color scale is the same for all patterns.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 33| Part 3| May 2026| Pages 552-561
https://doi.org/10.1107/S1600577526001608
Follow J. Synchrotron Rad.
Sign up for e-alerts
E-alerts
Follow J. Synchrotron Rad. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS