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Figure 5
Beam imaging captured by the ClearXCam for beams with varying diameters. (a)–(d) Images from the XFP beam­line using pinholes of (a) 1.50 mm, (b) 1.0 mm, (c) 500 µm, and (d) 150 µm. (e) Image from the XFM beam­line with a ∼2 µm beam. Features seen in parts (a)–(c) are attributed to in-beam structure, likely introduced by either the three-pole wiggler source or upstream beam­line optics.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 33| Part 3| May 2026| Pages 769-776
https://doi.org/10.1107/S1600577526001438
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