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Figure 7
Top (1a)–(8a): film strip sequence showing ClearXCam images recorded during a vertical focusing event at beam­line 17-BM, spanning approximately one minute as the front-end toroidal mirror was adjusted. This sequence of images shows how the beam evolves during focusing. Bottom rows (b) and (c): beam profiles in the horizontal (x) and vertical (y) directions, shown as cross-sections of beam intensity (slices through the 2D beam image) taken at the center of mass (COM), demonstrate a narrowing of the vertical peak width as the beam is brought into focus (the XFP beam does not focus in the horizontal direction). The crosshair is placed at the COM of the beam. The reduction in observed intensity between horizontal profiles (2b) and (3b) is attributed to motion of the beam on the detector during focusing as the mirror is adjusted. This case study illustrates the potential of pixelated diamond detectors for in-beam diagnostics and their com­pat­i­bility with automated beam-tuning optimization workflows.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 33| Part 3| May 2026| Pages 769-776
https://doi.org/10.1107/S1600577526001438
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