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![[Figure 9]](yn5129fig9mag.jpg)
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Figure 9
Top (bottom): change in the x coordinate (y coordinate) of the center of mass (COM) of the beam versus absorbed power in multi-stripe mode with 1 (blue), 5 (orange), 13 (green), and 25 (red) simultaneously biased stripes. The data were collected with no intentional movement between the beam and the sensor. The data show that beam drift sensitivity improves with increasing absorbed power. Power-law fits (dashed lines) are shown for each mode. At an absorbed power of ∼2.0 × 10−5 W (beam flux ∼4.0 × 1011 photons s−1) in 1-stripe mode, the ClearXCam can resolve ∼1 µm vertical beam drift, while in 25-stripe mode, similar precision is achieved at ∼8.5 × 10−6 W. At an absorbed power of ∼8.0 × 10−4 W (beam flux of ∼2.0 × 1013 photons s−1) in 25-stripe mode, the ClearXCam resolved ≲100 nm, which is less than 0.01% of the 1.5 mm beam diameter. The lower values for drift in the y direction are expected to be real and not an artifact of the instrument, showing a use case for in-beam diagnostics. We note that, given the transparency of the sensor, the absorbed power is about ∼1% of the beam incident power. |
![[Figure 9]](yn5129fig9.jpg)
 | JOURNAL OF SYNCHROTRON RADIATION |
ISSN: 1600-5775
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