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![[Figure 1]](bon5003fig1mag.jpg)
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Figure 1
(a) A schematic overview of a spectro-microscopy beamline [inspired by Hitchcock et al. (2005  )]. X-rays are focused onto a sample consisting of multiple chemical states with distinct absorption spectra. The transmitted signal is then measured at the detector. The sample is rastered through the focused beam, pixel-by-pixel, row-by-row. This process is repeated for different X-ray energies as shown schematically in (b). (c) An alternative measurement approach, where not every row of pixels is measured for each energy. This strategy is later referred to as random raster sampling. |
![[Figure 1]](bon5003fig1.jpg)
 | JOURNAL OF SYNCHROTRON RADIATION |
ISSN: 1600-5775
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