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Figure 1
(a) Schematic of the SI-GID setup. A focused X-ray beam illuminates a sample at a grazing-incidence angle, with scattered signals recorded by a 2D pixel detector (x-y plane). A coded aperture structures the beam along the y-axis, and scanning in this direction encodes scattering signals for local sample variation along the z-axis. (b) Top view of the sample and the X-ray footprint (green), to be resolved in the z-axis via SI-GID.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 33| Part 5| September 2026|
https://doi.org/10.1107/S1600577526005977
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