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Figure 4
(a) Reconstructed signals for detector pixels A and B, compared with simulations and experimental data, showing good agreement. (b) With SI-GID, the scattering pattern at each sample-pixel can be determined, providing N scattering patterns over the area instead of one scattering pattern as in traditional GI methods. This capability is important because it enables spatially resolved scattering characterization that is not fundamentally limited by the beam size, allowing local structural information to be reconstructed from within a broadly illuminated region. (c) Reconstructed surface images for peaks identified in Fig. 3[link]. Despite the weak scattering signal for some peaks, analysis can still be performed. (d) Overlay of selected reconstructed peaks on the optical image, highlighting spatial alignment.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 33| Part 5| September 2026|
https://doi.org/10.1107/S1600577526005977
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