A beam-direction cross-vessel metrology method and error analysis for the ptychography setup at HEPS ID09

Liao, R.; Ou, Z.; Yu, H.; Wang, X.; Dong, J.; Zhou, A.; Kang, W.; Zhou, L.; Tang, S.; Li, M.; Sheng, W.

doi:10.1107/S160057752600634X

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Figure 15
(a) Scanning trajectory from interferometers and piezo's capacitive sensors integrated in the PI stage. (b) Difference between the interferometer values and the PI stage readout.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 33| Part 5| September 2026|

https://doi.org/10.1107/S160057752600634X

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