A beam-direction cross-vessel metrology method and error analysis for the ptychography setup at HEPS ID09

Liao, R.; Ou, Z.; Yu, H.; Wang, X.; Dong, J.; Zhou, A.; Kang, W.; Zhou, L.; Tang, S.; Li, M.; Sheng, W.

doi:10.1107/S160057752600634X

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Figure 16
FRC resolution for the PI stage callback, the PI stage callback with position corrections, the interferometer system, and the interferometer system with position corrections are 13.9 nm, 12.7 nm, 14 nm and 12.3 nm, respectively. Scalebar: 2 µm.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 33| Part 5| September 2026|

https://doi.org/10.1107/S160057752600634X

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