Single-shot hard X-ray spectrometer with uniform spatial and spectral response

Singleton, M.M.; Sun, P.; Andersen, L.; Appel, K.; Descamps, A.; Glenzer, S.H.; Göde, S.; Humphries, O.S.; Kujala, N.; McBride, E.E.; Preston, T.R.; Rahul, S.V.; Zastrau, U.; Hastings, J.B.; Fletcher, L.B.

doi:10.1107/S1600577526007599

Figure 1
Schematic drawing of the experimental setup at the HED beamline of the European XFEL (not to scale). The incident X-ray spectrum is measured shot-by-shot using a high-resolution (HIREX) spectrometer. X-ray Thomson scattering (XRTS) from the sample is collected by von Hamos X-ray spectrometers based on HAPG crystals in both backward- and forward-scattering geometries within the interaction chamber (IC). A glassy carbon plate downstream of the sample provides the scattering signal, which is dispersed by a Si (444) flat analyzer crystal and recorded on a Jungfrau detector. A PVC pipe is used to transport the diffracted beam (in vacuum) from the glassy carbon to the Si crystal. The Si crystal's design includes a notch, as pictured, for strain relief. The detector edges and beamstop are masked.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 33| Part 5| September 2026|

https://doi.org/10.1107/S1600577526007599

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