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![[Figure 8]](ok5168fig8mag.jpg)
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Figure 8
Virtual commissioning alignment and characterization results obtained with the same Bluesky scan plans and Ophyd devices that will operate the real beamline. (a) M1 pitch acceptance: the M1 grazing pitch is scanned about its 2.5 mrad operating angle and the SSA-transmitted flux is fitted with a Gaussian (FWHM = 1.24 µrad, R2 = 0.999), quantifying the angular tolerance of the M1 alignment. (b) DCM Si(111) second-crystal rocking: the second-crystal fine pitch (Δθ2) is scanned about its operating angle and the transmitted flux is fitted with a Gaussian (FWHM = 1.10 µrad, R2 = 0.999), quantifying the angular tolerance of the DCM second-crystal alignment. (c) KB through-focus scan: the peak beam intensity is recorded as the evaluation plane is stepped through the sample position, and a Lorentzian fit gives a depth of focus (DOF) of 0.09 mm horizontally and 0.14 mm vertically. (d) Optimized beam at the sample plane: one-dimensional horizontal and vertical intensity profiles of the fully aligned focus, with FWHM = 46 nm (horizontal) and 58 nm (vertical). The microradian-scale acceptance widths in (a) and (b) are set by the beam walk across the 50 µm SSA over the 27.6–29 m lever arms (aperture-geometry-limited), not by the intrinsic mirror or crystal angular acceptance. |
![[Figure 8]](ok5168fig8.jpg)
 | JOURNAL OF SYNCHROTRON RADIATION |
ISSN: 1600-5775
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