XAFS measurement system using undulator synchronized on-the-fly monochromator scan at SPring-8 BL36XU

Ishiguro, N.; Uruga, T.; Kaneko, T.; Tanaka, T.; Joti, Y.; Motomura, K.; Yamazaki, H.; Senba, Y.; Ohashi, H.; Yabashi, M.; Takahashi, Y.

doi:10.1107/S160057752600768X

Figure 2
Calculated time profiles of (a) undulator-gap scan rate, (b) undulator gap, (c) photon energy of first-order X-ray emitted from the undulator and (d) the Si(111) c-CCM angle, at an undulator-gap synchronized monochromator on-the-fly scanning system.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 33| Part 5| September 2026|

https://doi.org/10.1107/S160057752600768X

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