XAFS measurement system using undulator synchronized on-the-fly monochromator scan at SPring-8 BL36XU

Ishiguro, N.; Uruga, T.; Kaneko, T.; Tanaka, T.; Joti, Y.; Motomura, K.; Yamazaki, H.; Senba, Y.; Ohashi, H.; Yabashi, M.; Takahashi, Y.

doi:10.1107/S160057752600768X

Figure 3
Time profiles of (a) the Si(111) c-CCM angle and (b) the I₀ photon count at undulator-gap synchronized QXAFS measurement. (c) Comparison of I₀ spectra by (black line) step-scan XAFS (1 s exposure per point, photon count scaled to 1/1000), (blue line) tapered and fixed undulator-gap QXAFS (taper: 1.1; measurement time: 6.4 s; sampling rate: 1 kHz), and (red line) undulator-gap synchronized QXAFS (measurement time: 6.4 s; sampling rate: 1 kHz).

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 33| Part 5| September 2026|

https://doi.org/10.1107/S160057752600768X

Open

access