XAFS measurement system using undulator synchronized on-the-fly monochromator scan at SPring-8 BL36XU

Ishiguro, N.; Uruga, T.; Kaneko, T.; Tanaka, T.; Joti, Y.; Motomura, K.; Yamazaki, H.; Senba, Y.; Ohashi, H.; Yabashi, M.; Takahashi, Y.

doi:10.1107/S160057752600768X

Figure 5
Comparison of Ni K-edge XAFS spectra of Pt₃Ni/C electrocatalysts in the MEA of the PEFC at PFY mode, obtained by (black line) step-scan XAFS (exposure time: 1 s point⁻¹), (blue line) tapered and fixed undulator-gap QXAFS (taper: 1.1; measurement time: 6.4 s; sampling rate: 700 Hz), and (red line) undulator-gap synchronized QXAFS (measurement time: 6.4 s; sampling rate: 700 Hz). (a) Full XAFS spectra, (b) XANES spectra and (c) k³-EXAFS oscillation. Data averaging and smoothing over Δk = 0.5 nm⁻¹ was applied to raw QXAFS measurement data in (c).

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 33| Part 5| September 2026|

https://doi.org/10.1107/S160057752600768X

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