A high-energy X-ray beamline for materials science research at SPring-8: BL15XU

Ohsumi, H.; Higo, Y.; Hayashi, Y.; Kim, J.; Tsujino, N.; Kakizawa, S.; Irifune, T.; Ohuchi, T.; Kono, Y.; Yumoto, H.; Koyama, T.; Yamazaki, H.; Senba, Y.; Ohashi, H.; Takano, H.; Sugahara, M.; Osaka, T.; Yabashi, M.

doi:10.1107/S1600577526006387

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Figure 15
Structural analysis of MgSiO₃ glass at ∼2 GPa. (a) Structure factor S(Q) and (b) PDF g(r) measured at BL15XU, compared with the result from Kondo et al. (2024

). The S(Q) and g(r) data from BL15XU are displayed with vertical offsets of 1.0 and 2.5, respectively. This comparison demonstrates the capability of the BL15XU setup to access a significantly wider Q range (up to ∼24 Å⁻¹). Consequently, the main conclusion drawn from this extended Q range is a highly improved real-space resolution in g(r), which enables the clear separation and distinct observation of the closely spaced Si–O and Mg–O peaks.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 33| Part 5| September 2026|

https://doi.org/10.1107/S1600577526006387

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