A real-time correction method for sample drift in STXM based on Fourier transform image registration

Jiao, Y.; Xu, Z.; Sun, T.; Zhang, Y.; Luo, Y.; Guo, Z.; Wang, Y.; Zhen, X.; He, J.; Tai, R.; Zhang, X.

doi:10.1107/S1600577526006429

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Figure 5
Sample drifts and LIM offsets of a stack scan with 40 energy points for a circular particle sample. The blue lines represent experimental data, while the red lines are linear fitting results. Sample drifts in (a) X and (b) Y directions. LIM offsets in (c) X and (d) Y directions.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 33| Part 5| September 2026|

https://doi.org/10.1107/S1600577526006429

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