A real-time correction method for sample drift in STXM based on Fourier transform image registration

Jiao, Y.; Xu, Z.; Sun, T.; Zhang, Y.; Luo, Y.; Guo, Z.; Wang, Y.; Zhen, X.; He, J.; Tai, R.; Zhang, X.

doi:10.1107/S1600577526006429

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Figure 8
Stack scan results without correction (a) or with coarse correction using LIM offsets (b). The sample comprises particles containing Ti, and the dark-blue outline denotes the sample position in the first image of each stack.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 33| Part 5| September 2026|

https://doi.org/10.1107/S1600577526006429

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