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Figure 2
A summary of experiment and analysis methods. (a) Beamline and instrument geometry for XST measurements at the SPB/SFX instrument of the European XFEL. (b, c) Transverse shifts of X-ray speckles are monitored inter-train and intra-train (solid contours) and are used to construct a virtual reference describing the average speckle position. This virtual reference (dashed) is purely numerical, and is updated iteratively such that it lies at the midpoint of the speckle displacements in all preceding pulses. A representative reference intensity is presented in (d), which reflects the mean speckle location of speckle patterns (b, c). (e, f) The transverse shift of speckles from the perturbed location (crossmark) are determined from the spatial correlation between local subsets of the perturbed intensity and an arbitrary intensity reference. The distance between the perturbed location and correlation maxima are used to calculate (g) the local intensity displacement field, from which we extract beam pointing statistics.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 33| Part 5| September 2026|
https://doi.org/10.1107/S1600577526005898
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