ASCANIO: a backscattering X-ray multichannel spectrometer for synchrotron applications

Barcella, P.; Ticchi, G.; Pedretti, B.; Garrevoet, J.; Brückner, D.; Borghi, G.; Carminati, M.; Falkenberg, G.; Fiorini, C.

doi:10.1107/S1600577526006843

Figure 9
(a) Plot of OCR against beam intensity, highlighting the different solid-angle coverage of the channels. (b) Plot of OCR against ICR, showcasing the almost-linear region at lower ICR.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 33| Part 5| September 2026| Pages 1467-1477

https://doi.org/10.1107/S1600577526006843

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