Single-shot third-harmonic spectral diagnostics for tender X-ray FEL pulses using a bent-crystal spectrometer

Arrell, C.; Lemke, H.; Prat, E.

doi:10.1107/S1600577526006739

Figure 1
Side view of the additional imaging system mounted on the bent-crystal spectrometer diffractometer arm at SwissFEL. The insertable Ce:YAG/CMOS camera module is positioned at ∼0.25 m from the bent Si(220) crystal and can be translated in and out of the beam to record single-shot third-harmonic spectra without changing the original 1.5 m detector geometry. The original far-field detector setup at 1.5 m remains available for standard bent-crystal spectrometer operation in the 4–13 keV range.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 33| Part 5| September 2026|

https://doi.org/10.1107/S1600577526006739

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