Monolithic integration of SiC diode detectors into scanning X-ray microscopy optical elements for in situ beam diagnostics

Trovato, G.; Finizio, S.; Moscato, S.; Raabe, J.; Reuteler, J.; Camarda, M.

doi:10.1107/S1600577526007113

Figure 2
(a) Complete setup for STXM measurement with the substitution of the standard elements with the functionalized SiC center stop and OSA. (b) Schematic front view of the OSA (top) and CS (bottom).

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 33| Part 5| September 2026| Pages 1338-1345

https://doi.org/10.1107/S1600577526007113

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