Monolithic integration of SiC diode detectors into scanning X-ray microscopy optical elements for in situ beam diagnostics

Trovato, G.; Finizio, S.; Moscato, S.; Raabe, J.; Reuteler, J.; Camarda, M.

doi:10.1107/S1600577526007113

Journal of Synchrotron Radiation Journal of
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Figure 7
Response comparison between the SiC OSA detector and the APD used for STXM measurements at varying X-ray beam energy, from 700 eV to 1000 eV. A relatively good overlap between the two measurements can be observed.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 33| Part 5| September 2026|

https://doi.org/10.1107/S1600577526007113

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