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Figure 8
(a) STXM image of the X-ray beam illuminating the SiC CS shown in Fig. 4[link]. (b) Response of the four individual sectors of the SiC diode [marked in (a)] to the focused X-ray beam illuminating the section of the diode.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 33| Part 5| September 2026|
https://doi.org/10.1107/S1600577526007113
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