Artifact segmentation using the U-Net architecture for powder X-ray diffraction images

Vong, A.; Yanxon, H.; Roberts, E.; Parraga, H.; Weng, J.; Xu, W.; Ruett, U.; Hexemer, A.; Zwart, P.H.; Schwarz, N.

doi:10.1107/S160057752600754X

Figure 4
An XRD image of Battery-1 dataset (a) without mask, (b) with GSAS-II algorithm mask and (c) with U-Net mask. The corresponding integrated 1D patterns are displayed in (d), (e) and (f), respectively. Panel (g) shows the calculated pattern from the three main phases in the sample, NMC, aluminium and lithium. Some peaks from the aluminium and lithium phases are marked by blue and red arrows, respectively, in (d).

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 33| Part 5| September 2026|

https://doi.org/10.1107/S160057752600754X

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