Design and performance of a capacitor-based burn-through monitor for high-power X-ray beams at XFEL facilities

Langeveld, W.; Rowen, M.; Prinz, A.; Armenta, R.; Chollet, M.; Gee, C.; Heimann, P.; Kirks, J.; Nakahara, K.; Ortiz, E.; Rokni, S.; Rosenstrom, A.; Sato, T.; Schlotter, B.; Smith, B.; Stefanescu, C.; Willard, Y.; Xiao, S.; Yavas, H.; Zhu, D.

doi:10.1107/S1600577526008647

Figure 6
Examples of traces collected with the slow ADC. Left: device shorted and did not recover. Center: device shorted and attempted to recover but failed. Right: device shorted and self-healed.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 33| Part 6| November 2026|

https://doi.org/10.1107/S1600577526008647

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