From analytical to data-driven: multi-method optimization of a bendable mirror system for dynamic focusing

Sun, B.; Wen, Z.; Zhu, Q.; Luo, J.; Xu, T.; Zhu, L.; Liang, Y.; Sun, J.; Li, Z.; Xia, S.; Xu, Z.; Wu, M.; Li, Q.; Zhang, W.; Yang, X.

doi:10.1107/S1600577526009422

Figure 6
Ray-tracing simulation results for a 1 nm X-ray beam under the XPS endstation configuration. (a) Simulated focal spot obtained from the ideal profile. (b) Simulated focal spot obtained from the measured surface profile. (c) Simulated focal spot obtained from the best-fit ellipse. (d) Comparison of the vertical intensity distributions along the Y direction for the three cases.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 33| Part 6| November 2026|

https://doi.org/10.1107/S1600577526009422

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