DanMAX – a beamline for materials science using powder X-ray diffraction, total scattering, and full-field tomographic imaging

Jørgensen, M.R.V.; Kantor, I.; Gjørup, F.H.; Sørensen, D.R.; Christensen, T.E.K.; Vasavan, H.N.; Panahifar, A.; Forcat, S.; Knudsen, E.B.; Alcocer, M.J.P.; Engelmann, F.; Enquist, H.; Iversen, B.B.; Li, Y.; Poulsen, H.F.; Sondhauss, P.; Tarawneh, H.; Weninger, C.

doi:10.1107/S1600577526009471

Figure 6
Comparison of diffraction patterns and fitted peak FWHM values obtained from diffraction powder standards at different conditions (Si NIST SRM 640f and LaB₆ NIST SRM 660c). (a) Diffraction patterns of Si powder packed in capillaries with varying diameters; SDD: 350 mm; energy: 35.00 keV. (b) Single-peak fit FWHM values of Si diffraction patterns (symbols) and expected resolution (line); SDD: 350 mm; energy: 35.00 keV. (c) Single-peak fit FWHM values of LaB₆ powders measured at varying distances and energies, keeping the Q_max constant (∼5.7 Å⁻¹) and expected resolution (line); capillary size: 100 µm.

JOURNAL OF
SYNCHROTRON
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ISSN: 1600-5775

Volume 33| Part 6| November 2026|

https://doi.org/10.1107/S1600577526009471

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