High-purity X-ray polarimetry at high energies for Mössbauer spectroscopy

Marx-Glowna, B.; Uschmann, I.; Loetzsch, R.; Hippler, W.; Görs, J.; Wunderlich, T.; Sadashivaiah, S.; Tolkiehn, M.; Paulus, G.G.; Röhlsberger, R.

doi:10.1107/S1600577526008702

Figure 3
(a) Illustration of the azimuthal crystal orientation. (b) Variation of the degree of polarization purity as a function of the azimuthal orientation of the crystal for the 5 7 11 Bragg reflection of silicon at E = 22.494 keV. The simulation was carried out using the multiple-wave diffraction algorithm (Schulze, 2018

). The azimuthal angle is measured relative to the crystallographic $[[\bar{6}\,\bar{2}\,4]]$ direction. The orange line indicates the polarization suppression of 10⁻⁸ (see Table 3

) required for the polarimeter when used in Mössbauer spectroscopy.

JOURNAL OF
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ISSN: 1600-5775

Volume 33| Part 6| November 2026|

https://doi.org/10.1107/S1600577526008702

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