High-purity X-ray polarimetry at high energies for Mössbauer spectroscopy

Marx-Glowna, B.; Uschmann, I.; Loetzsch, R.; Hippler, W.; Görs, J.; Wunderlich, T.; Sadashivaiah, S.; Tolkiehn, M.; Paulus, G.G.; Röhlsberger, R.

doi:10.1107/S1600577526008702

Figure 4
Measurement of the polarization purity for four-reflection Si (5 7 11) channel-cuts at a photon energy of 22.494 keV. The orange solid line corresponds to a fit with second-order polynomial. The vertical error bars represent the statistical uncertainties of the data points and the background measurement, assuming Poisson statistics with a 95% confidence level.

JOURNAL OF
SYNCHROTRON
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ISSN: 1600-5775

Volume 33| Part 6| November 2026|

https://doi.org/10.1107/S1600577526008702

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