Theoretical explanation of spatial coherence and source size characterization by X-ray grating interferometry

Lu, Y.; Wang, Z.; Du, X.; Wang, Q.; Hu, L.

doi:10.1107/S1600577526010544

Figure 1
Schematic layout of XGI and the physics model for beam characterization. A partially coherent X-ray beam illuminates a grating with period d. After free-space propagation over a distance z, the interference between the diffraction orders produces a modulated intensity pattern I_out(u, z) at the detector plane. The fringe visibility is obtained from Fourier analysis.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 34| Part 1| January 2027|

https://doi.org/10.1107/S1600577526010544

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