Theoretical explanation of spatial coherence and source size characterization by X-ray grating interferometry

Lu, Y.; Wang, Z.; Du, X.; Wang, Q.; Hu, L.

doi:10.1107/S1600577526010544

Figure 3
(a) Incident intensity profiles of two fully coherent Gaussian beams. The r.m.s. widths are σ_in = 50 µm (blue solid line) and σ_in = 100 µm (red dashed line). (b) Visibility curves extracted from simulated XGI interferograms (blue circles and red triangles) and analytical prediction based on equation (13)

(blue solid and red dashed lines).

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 34| Part 1| January 2027|

https://doi.org/10.1107/S1600577526010544

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