Theoretical explanation of spatial coherence and source size characterization by X-ray grating interferometry

Lu, Y.; Wang, Z.; Du, X.; Wang, Q.; Hu, L.

doi:10.1107/S1600577526010544

Figure 7
(a)–(e) Vertical CSD modulus |W_s( $[\bar\alpha]$ , Δα)| in the source plane (left) and the corresponding normalized profiles extracted at various positions $[\bar\alpha]$ in the range [−1.5σ, 1.5σ] (right). Here, σ denotes the r.m.s. size of the profile at Δα = 0. Cases: (a) 10×-size source, (b) HALF at 400 eV, (c) 0.1×-size source, (d) HEPS at 13.8 keV, and (e) APS-U at 11.3 keV.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 34| Part 1| January 2027|

https://doi.org/10.1107/S1600577526010544

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