forthcoming articles
The following articles are a selection of those recently accepted for publication in Journal of Synchrotron Radiation.
See also Forthcoming articles in all IUCr journals.



A compact gas attenuator for the SwissFEL ATHOS beamline realized using additive manufacturing
A compact gas attenuator for the SwissFEL ATHOS beamline with a custom manifold realized using additive manufacturing is described. First results show that the response is as expected from theoretical calculations.

Towards wavefront preservation X-ray crystal monochromator for high-repetition-rate FEL
The thermal deformation requirement for wavefront preservation through an X-ray crystal monochromator is found to restrict the standard deviation of the height error to less than 25 pm under certain conditions. By optimizing effective cooling temperature of liquid nitrogen cooled crystals, combined with the compensation of second order component in thermal deformation, we have an approach to reach this unprecedented requirement.

Quantitative alignment parameter estimation for analyzing X-ray photoelectron spectra
A model of X-ray photoelectron spectroscopy experiment accounting for photon beam asperities, sample geometry and kinetic energy analyzer is introduced. This model is related via the alignment parameter to a simple model commonly used for data interpretation. An alignment parameter estimation method is introduced and tested with simulated and experimental data.

A MHz X-ray diffraction set-up for dynamic compression experiments in the diamond anvil cell
A MHz X-ray diffraction set-up for the investigation of material behaviour under dynamic compression in the diamond anvil cell at intermediate strain rates has been developed at the High Energy Density (HED) instrument at the European XFEL.


Mapping nanocrystal orientations via scanning Laue diffraction microscopy for multi-peak Bragg coherent diffraction imaging
A workflow for orienting and mapping nanocrystals on a substrate of a different material lattice using scanning Laue diffraction microscopy has been established.