forthcoming articles
The following articles are a selection of those recently accepted for publication in Journal of Synchrotron Radiation.
See also Forthcoming articles in all IUCr journals.
Single-shot third-harmonic spectral diagnostics for tender X-ray FEL pulses using a bent crystal spectrometer
Third-harmonic spectral monitoring with an existing bent-crystal spectrometer provides single-shot bandwidth diagnostics and real-time machine tuning for tender X-ray FEL operation, and can be made non-invasive when combined with a suitable beam-sampling grating.
Ultrafast time-resolved small-angle X-ray scattering setup on the FemtoMAX beamline
The feasibility is demonstrated of performing time-resolved small-angle X-ray scattering measurements with picosecond temporal resolution on the FemtoMAX beamline at the MAX IV Laboratory in Sweden.
Fine-tuning ab initio XANES spectra calculations using the Bayesian optimization algorithm
A Bayesian optimization technique is used to tune the FEFF and FDMNES packages and to improve matching between theoretical and experimental spectra. The tests were performed on monometallic Ni, Fe and Pd K-edge XANES spectra using several different spectrum similarity metrics.
The prototype DynamiX camera system – a high-frame-rate high-dynamic-range hard X-ray integrating detector for fourth-generation synchrotrons
This paper presents the first results from the DynamiX X-ray imaging detector developed by the UK's Science and Technology Facilities Council for a new generation of photon light sources. Operating at a continuous frame rate of 534 kHz and with a per-pixel per-frame dynamic range of roughly five orders of magnitude, this work is the first step in delivering a transformative new imaging technology.
A high-energy X-ray beamline for materials science research at SPring-8: BL15XU
The Japanese synchrotron facility SPring-8 has recently relaunched BL15XU as a high-energy X-ray beamline for materials science research. A comprehensive description of the technical details and science cases is presented.
A beam direction cross-vessel metrology method and error analysis for ptychography setup at HEPS ID09
A beamline-direction cross-vessel metrology method and error analysis for ptychography setup at HEPS ID09 is proposed and implemented. A 12.3 nm reconstruction resolution of ptychography demonstrates the validity of metrology.

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