Refinement of the layered titanosilicate AM-1 from single-crystal X-ray diffraction data

Ferdov, S.; Kolitsch, U.; Lengauer, C.; Tillmanns, E.; Lin, Z.; Sá Ferreira, R.A.

doi:10.1107/S160053680704812X

Acta Crystallographica Section E
Acta Crystallographica
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Figure 1 Connectivity in AM-1, shown with displacement ellipsoids at the 50% probability level. [Symmetry codes: (i) y + $[{1\over 2}]$ , 1/2-x, z; (ii) 1/2-y, x + $[{1\over 2}]$ , z; (iii) y- 1/2, 1/2-x; (iv) −x, 1-y, z.]

CRYSTALLOGRAPHIC
COMMUNICATIONS

ISSN: 2056-9890

Volume 63| Part 11| November 2007| Page i186

https://doi.org/10.1107/S160053680704812X

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